School of Technology Management & Engineering
PhD (Electrical Engineering- VLSI Testing) IIT Bombay, M.E. (Electronics) SPCE, Mumbai, B.E. (Electronics) SPCE, Mumbai
Email ID: toral.shah@nmims.edu
Courses taken:
Discrete Mathematics, Computer Organisation and Architecture, Python Programming, UNIX Programming, Microprocessors and Microcontrollers, Technical Paper Reading, and Writing Skills
Certifications:
P.G. Diploma in VLSI Design |
CDAC (Pune, India) |
2001 |
Adult Education |
George Brown College (Toronto, Canada) |
2011 |
Special Personality Development Course-II Specialisation: Counselling |
Nrityanjali Institute |
2022 |
Cognitive Research and Leadership |
Shastri Indo Canadian Institute |
2022 |
Reviewer
International conference on VLSI Design and Test (VDAT) 2022
IEI-BLC-FCRIT Excellence awards-2022 Edition
Teaching Experience
20 Years
Service to the University
Ph.D. Thesis
Fully Testable Circuit Synthesis for Delay and Multiple Stuck-at Faults |
Mumbai |
|
Indian Institute of Technology Bombay |
Jan 2013 - Aug 2018 |
Advisor: Prof. Virendra Singh
Research Interest
Data Science Applications, Delay testable synthesis ,Testable architectures , Design-for-Test ,Applications of scan based testing ,Hardware security
Publications
Journal of Electronic Testing (JETTA), (Volume 34, Number 1), February 2018, Impact factor: 0.55
http://link.springer.com/article/10.1007/s10836-018-5703-3
Conference Publications
Benefits of Mindfulness Meditation in Academics first International Research
Conference on Mindfulness, IIM Bodhgaya, February 2022
Test Pattern Generation to Detect Multiple Faults in ROBDD based combinational Circuits
23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2017, Greece
http://ieeexplore.ieee.org/document/8046223/
Testing multiple stuck-at faults of ROBDD based combinational circuit design
18th IEEE Latin American Test Symposium (LATS) 2017, Bogota, Colombia
http://ieeexplore.ieee.org/document/7906753/
ROBDD based Path Delay Fault testable combinational circuit design
14th IEEE East-West Design and Test Symposium (EWDTS), 2016, Yerevan, Armenia
http://ieeexplore.ieee.org/document/7807682/
BDD based PDF testable combinational circuit design
14th IEEE Workshop on RTL and High-Level Testing (WRTLT) 2015, Mumbai, India
PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuits
8th VLSI Design and Test (VDAT) 2015, Ahmedabad, India
http://ieeexplore.ieee.org/document/7208130/
Simplification of Fully Delay Testable Combinational circuits
21st IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2015, Halkidiki, Greece
http://ieeexplore.ieee.org/document/7229829/
Multiple Stuck-at Fault Testability of a Combinational Circuit Derived by Covering ROBDD Nodes by Invert-And-Or Sub-circuits
13th IEEE East-West Design and Test Symposium (EWDTS) 2015, Batumi, Georgia
http://ieeexplore.ieee.org/document/7493099/
An Improved Single-Input-Change (SIC) Based Built-In-Self-Test for Delay Testing
13th IEEE Workshop on RTL and High-Level Testing (WRTLT) 2014, Hangzhou, China
Spirituality as Science: Experience is Proof
8th All India Students Conference on Science and Spiritual Quest (AISSQ) 2014, IIT BHU, India
http://www.academia.edu/4908966/Spirituality_as_Science_Experience_is_Proof